首页> 外国专利> WETTING WAVE FRONT CONTROL FOR REDUCED AIR ENTRAPMENT DURING WAFER ENTRY INTO ELECTROPLATING BATH

WETTING WAVE FRONT CONTROL FOR REDUCED AIR ENTRAPMENT DURING WAFER ENTRY INTO ELECTROPLATING BATH

机译:晶片进入电解槽过程中的湿波前控制,减少了空气的夹带

摘要

The method described herein allows the electrolyte to be moved in such a way that air capture due to the initial impact of the wafer and / or wafer holder and electrolyte is reduced and the electrolyte wet wavefront is maintained while minimizing air capture throughout the immersion of the wafer. Manage wafer acquisition into the furnace.
机译:本文所述的方法允许电解质以如下方式移动:减少由于晶片和/或晶片保持器的初始冲击而引起的空气捕获,并且减少电解质并维持电解质湿波前,同时在整个浸入水中使空气捕获最小化。硅片。管理晶片到炉中的获取。

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