Defect inspection method for light-transmitting film, manufacturing method for linear polarizer film, and manufacturing method for polarizing plate

摘要

The inspection method for defects in a light transmissive film according to one embodiment is a method for inspecting defects in a light transmissive film that is the film to be inspected by, while emitting linearly polarized light as illumination light to a film S to be inspected having light transmittance, capturing an image of the film to be inspected by an imaging device 13 via a linear polarizing plate 12B that is disposed between the film to be inspected and the imaging device in a state of the absorption axis A12B intersecting a direction perpendicular to the oscillation plane of the linearly polarized light, wherein when the linearly polarized light is emitted to the film to be inspected, the difference between the maximum intensity wavelength of the incident light transmitted through the film to be inspected and the linear polarizing plate and incident on the imaging device and the maximum sensitivity wavelength of the imaging device is 50 nm or less.