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Atomic layer etching using a combination of plasma and vapor treatments

机译:结合等离子体和蒸气处理的原子层蚀刻

摘要

A method for performing atomic layer etching (ALE) on a substrate, including the following method operations: performing a surface modification operation on a surface of the substrate, the surface modification operation configured to convert at least one monolayer of the substrate surface to a modified layer; performing a removal operation on the substrate surface, to remove the modified layer from the substrate surface, wherein removing the modified layer includes exposing the substrate surface to a metal complex, such that a ligand exchange reaction occurs between the metal complex and converted species of the modified layer; performing, following the removal operation, a plasma treatment on the substrate surface, the plasma treatment configured to remove residues formed from the exposure of the substrate surface to the metal complex, wherein the residues are volatilized by the plasma treatment; repeating the foregoing operations until a predefined thickness has been etched from the substrate surface.
机译:一种在基板上执行原子层蚀刻(ALE)的方法,包括以下方法操作:在基板的表面上执行表面修饰操作,该表面修饰操作被配置为将基板表面的至少一个单层转换为修饰的表面。层;在衬底表面上执行去除操作,以从衬底表面去除改性层,其中去除改性层包括将衬底表面暴露于金属络合物,从而在金属络合物和硅酸盐的转化物种之间发生配体交换反应。改性层在去除操作之后,在基板表面上进行等离子体处理,该等离子体处理被配置为去除由基板表面暴露于金属络合物而形成的残留物,其中该残留物通过等离子体处理而挥发;重复上述操作,直到已经从基板表面蚀刻出预定厚度。

著录项

  • 公开/公告号US10784118B2

    专利类型

  • 公开/公告日2020-09-22

    原文格式PDF

  • 申请/专利权人 LAM RESEARCH CORPORATION;

    申请/专利号US201916289428

  • 申请日2019-02-28

  • 分类号C23C16/02;C23F1;C23F1/12;C23F4;H01J37/32;H01L21/02;H01L21/3065;H01L21/311;H01L21/3213;

  • 国家 US

  • 入库时间 2022-08-21 11:30:16

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