首页> 外国专利> Method to Determine Properties of a Coating on a Transparent Film, Method for Manufacturing a Capacitor Film and Device to Determine Properties of a Coating on a Transparent Film

Method to Determine Properties of a Coating on a Transparent Film, Method for Manufacturing a Capacitor Film and Device to Determine Properties of a Coating on a Transparent Film

机译:确定透明膜上的涂层的性质的方法,制造电容器膜的方法和确定透明膜上的涂层的性质的装置

摘要

A method for determining properties of a coating on a transparent film, a method for manufacturing a capacitor film and a device configured to determine properties of a coating on a transparent film are disclosed. In an embodiment a method includes moving the transparent film with the coating on a path which passes between a light source and a sensor, illuminating, by the light source, the coating on the transparent film, detecting, by the sensor, an intensity of transmitted light from the light source and calculating, by a processor, the properties of the coating on the transparent film based on the detected intensity of transmitted light.
机译:本发明公开了一种用于确定透明膜上的涂层的性质的方法,一种用于制造电容器膜的方法以及一种用于确定透明膜上的涂层的性质的装置。在一个实施例中,一种方法包括:使带有涂层的透明膜在光源和传感器之间通过的路径上移动;通过光源照射透明膜上的涂层;通过传感器检测透射的强度。光源发出的光,并由处理器根据检测到的透射光强度计算透明膜上涂层的特性。

著录项

  • 公开/公告号US2020326177A1

    专利类型

  • 公开/公告日2020-10-15

    原文格式PDF

  • 申请/专利权人 TDK ELECTRONICS AG;

    申请/专利号US201816651919

  • 申请日2018-11-22

  • 分类号G01B11/06;G01N21/84;G01N21/86;G01N21/59;H01G4;

  • 国家 US

  • 入库时间 2022-08-21 11:26:25

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