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Method and Apparatus for Characterizing Laser Gain Chips

机译:表征激光增益芯片的方法和装置

摘要

A system adapted for characterizing gain chips and a method for characterizing gain chips are disclosed. The system includes a probe light source that generates an output light signal characterized by a wavelength that can be varied in response to a wavelength control signal and a mounting stage adapted for receiving a gain chip characterized by a waveguide having a reflective face on a first surface of the gain chip and a transparent face on a second surface of the gain chip. The system also includes an optical system that focuses the output light signal into the waveguide through the transparent face; and a controller that causes the probe light source to generate the output light signal and measures an intensity of light both with and without the gain chip being powered for each of a plurality of different wavelengths to form a gain profile for the gain chip.
机译:公开了一种适于表征增益芯片的系统和一种表征增益芯片的方法。该系统包括:探针光源,其产生特征在于可以响应波长控制信号而变化的波长的输出光信号;以及安装台,其适于接收特征在于具有在第一表面上具有反射面的波导的增益芯片。增益芯片的第二表面和增益芯片的第二表面上的透明面。该系统还包括光学系统,该光学系统将输出的光信号通过透明面聚焦到波导中。控制器,其使探测光源产生输出光信号,并在为多个不同波长中的每一个波长供电和不对增益芯片供电的情况下测量光的强度,以形成增益芯片的增益分布。

著录项

  • 公开/公告号US2020264104A1

    专利类型

  • 公开/公告日2020-08-20

    原文格式PDF

  • 申请/专利权人 AGILENT TECHNOLOGIES INC.;

    申请/专利号US201916277917

  • 发明设计人 GUTHRIE PARTRIDGE;

    申请日2019-02-15

  • 分类号G01N21/59;

  • 国家 US

  • 入库时间 2022-08-21 11:24:56

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