首页> 外国专利> SEMICONDUCTOR MPS DIODE WITH REDUCED CURRENT-CROWDING EFFECT AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR MPS DIODE WITH REDUCED CURRENT-CROWDING EFFECT AND MANUFACTURING METHOD THEREOF

机译:减小电流蔓延效应的半导体MPS二极管及其制造方法

摘要

A merged-PN-Schottky, MPS, diode includes an N substrate, an N-drift layer, a P-doped region in the drift layer, an ohmic contact on the P-doped region, a plurality of cells within the P-doped region and being portions of the drift layer where the P-doped region is absent, an anode metallization on the ohmic contact and on said cells, to form junction-barrier contacts and Schottky contacts respectively. The P-doped region has a grid-shaped layout separating from one another each cell and defining, together with the cells, an active area of the MPS diode. Each cell has a same geometry among quadrangular, quadrangular with rounded corners and circular; and the ohmic contact extends at the doped region with continuity along the grid-shaped layout.
机译:合并式PN肖特基MPS二极管包括N衬底,N漂移层,漂移层中的P掺杂区域,P掺杂区域上的欧姆接触,P掺杂内部的多个单元在阳极区和在所述电池上的阳极金属化分别形成结-势垒接触和肖特基接触,并且在漂移层的其中不存在P-掺杂区的部分。 P掺杂区具有栅格形布局,每个单元彼此分隔开,并且与单元一起限定了MPS二极管的有源区。每个像元在四边形,具有圆角的四边形和圆形之间具有相同的几何形状;欧姆接触在掺杂区沿网格状布局连续延伸。

著录项

  • 公开/公告号US2020303564A1

    专利类型

  • 公开/公告日2020-09-24

    原文格式PDF

  • 申请/专利权人 STMICROELECTRONICS S.R.L.;

    申请/专利号US202016825214

  • 发明设计人 SIMONE RASCUNA;MARIO GIUSEPPE SAGGIO;

    申请日2020-03-20

  • 分类号H01L29/872;H01L29/20;H01L29/16;H01L29/06;H01L29/45;H01L29/47;H01L29/66;

  • 国家 US

  • 入库时间 2022-08-21 11:24:12

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