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SiC Power Semiconductor Device with Integrated Schottky Junction

机译:集成肖特基结的SiC功率半导体器件

摘要

Embodiments of SiC devices and corresponding methods of manufacture are provided. In some embodiments, the SiC device has shielding regions at the bottom of some gate trenches and non-linear junctions formed with the SiC material at the bottom of other gate trenches. In other embodiments, the SiC device has the shielding regions at the bottom of the gate trenches and arranged in rows which run in a direction transverse to a lengthwise extension of the trenches. In still other embodiments, the SiC device has the shielding regions and the non-linear junctions, and wherein the shielding regions are arranged in rows which run in a direction transverse to a lengthwise extension of the trenches.
机译:提供了SiC器件的实施方式和相应的制造方法。在一些实施例中,SiC器件在一些栅极沟槽的底部具有屏蔽区,并且在其他栅极沟槽的底部具有由SiC材料形成的非线性结。在其他实施例中,SiC器件在栅沟槽的底部具有屏蔽区域,并且以横向于沟槽的纵向延伸的方向延伸的行布置。在其他实施例中,SiC器件具有屏蔽区域和非线性结,并且其中屏蔽区域以行布置,该行在横向于沟槽的纵向延伸的方向上延伸。

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