首页> 外国专利> METHOD FOR INTEGRATING COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR (CMOS) DEVICES WITH MICROELECTROMECHANICAL SYSTEMS (MEMS) DEVICES USING A FLAT SURFACE ABOVE A SACRIFICIAL LAYER

METHOD FOR INTEGRATING COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR (CMOS) DEVICES WITH MICROELECTROMECHANICAL SYSTEMS (MEMS) DEVICES USING A FLAT SURFACE ABOVE A SACRIFICIAL LAYER

机译:使用附加层上的平整表面将互补金属氧化物-半导体器件与微机电系统(MEMS)设备集成的方法

摘要

An integrated circuit (IC) with an integrated microelectromechanical systems (MEMS) structure is provided. In some embodiments, the IC comprises a semiconductor substrate, a back-end-of-line (BEOL) interconnect structure, the integrated MEMS structure, and a cavity. The BEOL interconnect structure is over the semiconductor substrate, and comprises wiring layers stacked in a dielectric region. Further, an upper surface of the BEOL interconnect structure is planar or substantially planar. The integrated MEMS structure overlies and directly contacts the upper surface of the BEOL interconnect structure, and comprises an electrode layer. The cavity is under the upper surface of the BEOL interconnect structure, between the MEMS structure and the BEOL interconnect structure.
机译:提供了具有集成微机电系统(MEMS)结构的集成电路(IC)。在一些实施例中,IC包括半导体衬底,线后端(BEOL)互连结构,集成MEMS结构和腔。 BEOL互连结构在半导体衬底上方,并且包括堆叠在电介质区域中的布线层。此外,BEOL互连结构的上表面是平坦的或基本平坦的。集成的MEMS结构覆盖并直接接触BEOL互连结构的上表面,并且包括电极层。空腔在BEOL互连结构的上表面下方,在MEMS结构和BEOL互连结构之间。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号