首页> 外国专利> Methods for Processing a Wide Band Gap Semiconductor Wafer, Methods for Forming a Plurality of Thin Wide Band Gap Semiconductor Wafers, and Wide Band Gap Semiconductor Wafers

Methods for Processing a Wide Band Gap Semiconductor Wafer, Methods for Forming a Plurality of Thin Wide Band Gap Semiconductor Wafers, and Wide Band Gap Semiconductor Wafers

机译:用于处理宽带隙半导体晶片的方法,用于形成多个薄宽带隙半导体晶片的方法以及宽带隙半导体晶片

摘要

A method for processing a wide band gap semiconductor wafer is proposed. The method includes depositing a non-monocrystalline support layer at a back side of a wide band gap semiconductor wafer, depositing an epitaxial layer at a front side of the wide band gap semiconductor wafer, and splitting the wide band gap semiconductor wafer along a splitting region to obtain a device wafer including at least a part of the epitaxial layer, and a remaining wafer including the non-monocrystalline support layer.
机译:提出了一种用于宽带隙半导体晶片的处理方法。该方法包括:在宽带隙半导体晶片的背面上沉积非单晶支撑层;在宽带隙半导体晶片的正面上沉积外延层;以及沿着分裂区域分裂宽带隙半导体晶片。获得包括至少一部分外延层的器件晶片,以及包括非单晶支撑层的剩余晶片。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号