首页> 外国专利> THREE-DIMENSIONAL INVERSE FLAT NAND MEMORY DEVICE CONTAINING PARTIALLY DISCRETE CHARGE STORAGE ELEMENTS AND METHODS OF MAKING THE SAME

THREE-DIMENSIONAL INVERSE FLAT NAND MEMORY DEVICE CONTAINING PARTIALLY DISCRETE CHARGE STORAGE ELEMENTS AND METHODS OF MAKING THE SAME

机译:包含部分离散电荷存储元件的三维逆平板闪存存储器及其制造方法

摘要

A three-dimensional memory device includes alternating stacks of insulating strips and electrically conductive strips located over a substrate and laterally spaced apart among one another by line trenches. The line trenches laterally extend along a first horizontal direction and are spaced apart along a second horizontal direction. Each line trench fill structure includes a laterally undulating dielectric rail having a laterally undulating width along the second horizontal direction and extending along the first horizontal direction and a row of memory stack structures located at neck regions of the laterally undulating dielectric rail. Each memory stack structure includes a vertical semiconductor channel, a blocking dielectric contacting an outer sidewall of the vertical semiconductor channel, and a charge storage layer contacting an outer sidewall of the blocking dielectric, vertically extending continuously through each level of the electrically conductive strips, and having a vertically undulating lateral thickness.
机译:一种三维存储装置,包括绝缘带和导电带的交替堆叠,这些绝缘带和导电带位于基板上方并且通过线沟槽在横向上彼此间隔开。线沟槽沿着第一水平方向横向延伸并且沿着第二水平方向间隔开。每个线沟槽填充结构包括横向起伏的介电轨,该横向起伏的介电轨沿第二水平方向具有横向起伏的宽度并且沿着第一水平方向延伸,以及位于横向起伏的介电轨的颈部区域的一排存储器堆叠结构。每个存储器堆叠结构包括垂直半导体通道,与垂直半导体通道的外侧壁接触的阻挡电介质,以及与阻挡电介质的外侧壁接触的电荷存储层,该电荷存储层连续连续地延伸穿过导电条的每一层,以及具有垂直起伏的横向厚度。

著录项

  • 公开/公告号US2020006375A1

    专利类型

  • 公开/公告日2020-01-02

    原文格式PDF

  • 申请/专利权人 SANDISK TECHNOLOGIES LLC;

    申请/专利号US201816020505

  • 发明设计人 FEI ZHOU;YINGDA DONG;RAGHUVEER S. MAKALA;

    申请日2018-06-27

  • 分类号H01L27/11582;H01L27/1157;H01L27/11565;

  • 国家 US

  • 入库时间 2022-08-21 11:20:15

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