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FIVE-DEGREE-OF-FREEDOM HETERODYNE GRATING INTERFEROMETRY SYSTEM

机译:五度异戊二烯分级干涉测量系统

摘要

A five-degree-of-freedom heterodyne grating interferometry system comprises: a single-frequency laser (1), used to emit single-frequency laser light, wherein the single-frequency laser light can be split into a reference light beam and a measurement light beam; an interferometer lens set (3) and a measurement grating (4), used to convert the reference light and the measurement light into a reference interference signal and a measurement interference signal; and multiple optical fiber bundles (5), respectively receiving the measurement interference signal and the reference interference signal, wherein each optical fiber bundle (5) has multiple multi-mode optical fibers respectively receiving interference signals at different positions on the same plane. The measurement system is not over-sensitive to the environment, is small and light, and is easy to arrange. Six-degree-of-freedom ultra-precision measurement can be achieved by arranging multiple five-degree-of-freedom interferometry systems and using redundant information, thereby meeting the needs of a lithography machine workpiece table for six-degree-of-freedom position and orientation measurement.
机译:一种五自由度外差光栅干涉仪系统,包括:单频激光器(1),用于发射单频激光,其中,所述单频激光可以分为参考光束和测量光束。光束干涉仪透镜组(3)和测量光栅(4),用于将参考光和测量光转换为参考干涉信号和测量干涉信号;多个光纤束(5)分别接收测量干扰信号和参考干扰信号,其中每个光纤束(5)具有多个多模光纤,分别在同一平面上的不同位置接收干扰信号。测量系统对环境不敏感,体积小,重量轻,易于布置。通过布置多个五自由度干涉仪系统并使用冗余信息,可以实现六自由度超精密测量,从而满足光刻机工件台对六自由度位置的需求和方向测量。

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