首页> 外国专利> TWO-DEGREE-OF-FREEDOM HETERODYNE GRATING INTERFEROMETRY MEASUREMENT SYSTEM

TWO-DEGREE-OF-FREEDOM HETERODYNE GRATING INTERFEROMETRY MEASUREMENT SYSTEM

机译:两自由度异戊二烯光栅干涉测量系统

摘要

Disclosed is a two-degree-of-freedom heterodyne grating interferometry measurement system, comprising: a single-frequency laser device (1) for emitting a single-frequency laser, wherein the single-frequency laser can be split into a beam of reference light and a beam of measurement light; an interferometer mirror group (3) and a measurement grating (4) for forming a reference interference signal and a measurement interference signal from the reference light and the measurement light; and a receiving optical fiber (5) for receiving the reference interference signal and the measurement interference signal, wherein a core diameter of the receiving optical fiber (5) is less than the width of an interference fringe of the reference interference signal and the measurement interference signal, so that the receiving optical fiber (5) receives a part of the reference interference signal and the measurement interference signal. The measurement system has the advantages of insensitivity to a grating rotation angle error, a small volume, a light weight, facilitating arrangement, etc., and is particularly suitable for a scenario with a higher requirement for an installation error in industrial application.
机译:公开了一种二自由度外差光栅干涉测量系统,包括:用于发射单频激光的单频激光装置(1),其中所述单频激光可以被分成参考光束。一束测量光;干涉仪镜组(3)和测量光栅(4),用于从参考光和测量光形成参考干涉信号和测量干涉信号;接收光纤(5),其用于接收参考干扰信号和测量干扰信号,其中,接收光纤(5)的芯径小于参考干扰信号和测量干扰的干扰条纹的宽度。信号,从而使接收光纤(5)接收一部分参考干扰信号和测量干扰信号。该测量系统具有对光栅旋转角误差不敏感,体积小,重量轻,布置方便等优点,特别适合于工业应用中对安装误差有较高要求的场景。

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