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FIVE-DEGREE-OF-FREEDOM HETERODYNE GRATING INTERFEROMETRY SYSTEM

机译:五度自由度外差光栅干涉系统

摘要

A five-degree-of-freedom heterodyne grating interferometry system comprises: a single-frequency laser for emitting single-frequency laser light, the single-frequency laser light can be split into a reference light beam and a measurement light beam; an interferometer lens set and a measurement grating for converting the reference light and the measurement light into a reference interference signal and a measurement interference signal; and multiple optical fiber bundles, respectively receiving the measurement interference signal and the reference interference signal, wherein each optical fiber bundle has multiple multi-mode optical fibers respectively receiving interference signals at different positions on the same plane. The measurement system is not over-sensitive to the environment, is small and light, and is easy to arrange. Six-degree-of-freedom ultra-precision measurement can be achieved by arranging multiple five-degree-of-freedom interferometry systems and using redundant information, thereby meeting the needs of a lithography machine workpiece table for six-degree-of-freedom position and orientation measurement.
机译:五度的自由度外差干涉光栅系统包括:一个单频的激光用于发射单频激光时,单频激光可以被分裂成参考光束和测量光束;干涉仪透镜组和测量光栅,用于参考光和测量光成参考干扰信号和测量干扰信号转换;和多个光纤束,分别接收所述测量的干扰信号和参考干扰信号,其中,每个光纤束具有在同一平面上的不同位置分别接收的干扰信号的多个多模光纤。该测量系统是不是对环境过度敏感,小而轻,易于安排。六度的自由度超精密测量可以通过布置五度的自由度多个干涉系统和使用冗余信息,从而满足为6度的自由度位置的光刻机工件台的需求来实现和方位测量。

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