Provided are an image inspection instrument generation device, an image inspection instrument generation program, and an image inspection instrument generation method that enable generation of image inspection instruments having high inspection accuracy without need of a large amount of images. An image inspection instrument generation device 50 is provided with an image inspection instrument generation unit 45 that, through machine learning based on learning images LG and inspection standards 32 for inspection objects, generates image inspection instruments 33 for inspecting inspection objects included in images. The inspection standards 32 include information about state variables of the inspection objects, state values of the state variables, and classes into which the inspection objects are classified.
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