SEMICONDUCTOR DEVICE TEST SYSTEM, SEMICONDUCTOR DEVICE TEST METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD

摘要

According to an embodiment of the present invention, provided is a semiconductor device test system which comprises: a body having an internal space in which a test device is seated; and a cover combined with the body to cover the internal space. The cover includes a first cover including first openings arranged in two dimensions and a second cover including second openings arranged in two dimensions, wherein the arrangement of the first openings is different from the arrangement of the second openings.;COPYRIGHT KIPO 2020