METHOD AND DEVICE FOR GENERATING TEST PATTERNS AND SELECTING OPTIMIZED TEST PATTERNS AMONG THE TEST PATTERNS IN ORDER TO VERIFY INTEGRITY OF CONVOLUTION OPERATIONS TO ENHANCE FAULT TOLERANCE AND FLUCTUATION ROBUSTNESS IN EXTREME SITUATIONS

摘要

The present invention relates to a method and apparatus for generating a test pattern to verify the integrity of a convolution operation, and selecting an optimized test pattern from the test patterns. More specifically, in the method of generating one or more test patterns to verify the integrity of one or more convolutional operations, and selecting one or more optimization test patterns from the test patterns, the computing device may include (a) at least one pattern. The generation unit is configured to generate the test pattern using a predetermined function, but the test is performed so that saturation does not occur in the process of applying the convolution operation after the test pattern is input to at least one original CNN. Causing a pattern to be generated; (b) causing the computing device to generate at least one pattern evaluation unit, with reference to each of the test pattern and one or more parameters of the original CNN, to generate each evaluation score of each of the test patterns; And (c) causing the computing device to select at least one pattern selection unit to select the optimization test pattern from the test patterns with reference to the evaluation scores. It is about.