首页> 外国专利> WAFER PROCESSING DEVICE FOR CONTROLLING SEMICONDUCTOR WAFER SHAPE ULTRA-FLATNESS

WAFER PROCESSING DEVICE FOR CONTROLLING SEMICONDUCTOR WAFER SHAPE ULTRA-FLATNESS

机译:用于控制半导体晶片形状的超薄晶片的晶片处理装置

摘要

The present invention is to provide an ultra-flattened shape-controlled wafer processing apparatus for minimizing warpage or contact area during transfer of a wafer in which IC chips are arranged. The present invention is a polishing pad 11 is attached to the upper surface, the rotating platen (10); And a polishing head 20 having at least one device on the upper side of the polishing pad 11 and rotating while applying pressure to support a silicon wafer and contact the surface of the polishing pad 11, wherein the polishing The head 20 moves the position so that the rotation center of the silicon wafer moves reciprocally from the surface of the polishing pad 11 to the edge, and the groove H recessed in the center of the surface of the silicon wafer It provides a carrier wafer processing apparatus for semiconductor manufacturing to form a carrier wafer (CW) forming a. The present invention can stably and efficiently process the carrier wafer for preventing warpage and minimizing the contact area during transfer of the wafer where the IC chip is arranged.
机译:本发明旨在提供一种超扁平形状控制的晶片处理设备,该设备用于最小化在其中布置了IC芯片的晶片的传送期间的翘曲或接触面积。本发明是在抛光垫11的上表面附着有旋转压盘(10);以及抛光头20,其在抛光垫11的上侧具有至少一个装置,并且在施加压力以支撑硅晶片并接触抛光垫11的表面的同时旋转,其中抛光头20移动该位置使得硅晶片的旋转中心从抛光垫11的表面向边缘往复运动,并且凹槽H凹入硅晶片的表面的中心。提供用于半导体制造以形成载体的载体晶片处理设备。晶片(CW)形成本发明可以稳定且有效地处理载体晶片,以防止在布置IC芯片的晶片的传送期间翘曲并使接触面积最小化。

著录项

  • 公开/公告号KR102142236B1

    专利类型

  • 公开/公告日2020-08-06

    原文格式PDF

  • 申请/专利权人 J-3 CO. LTD.;

    申请/专利号KR20200003486

  • 发明设计人 이경환;

    申请日2020-01-10

  • 分类号B24B37/10;B24B37/20;B24B57/02;

  • 国家 KR

  • 入库时间 2022-08-21 11:04:05

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号