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Laboratory setup for dynamic measurement of input and output characteristics of a semiconductor transistor
Laboratory setup for dynamic measurement of input and output characteristics of a semiconductor transistor
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机译:动态测量半导体晶体管输入和输出特性的实验室设置
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摘要
The utility model relates to measuring equipment and educational scientific laboratory equipment in the field of measurement and control of electrophysical parameters of semiconductor transistors. A laboratory setup for dynamically measuring the families of input and output characteristics of a semiconductor transistor, comprising a main measuring circuit consisting of a resistance and configured to connect an investigated transistor, sawtooth and step voltage generators to it, characterized in that the step voltage generator is based on a digital-to-analog converter, converting a digital code into a step voltage from a digital counter that reads pulses, forms uemye master oscillator rectangular voltages. In addition, the main measuring circuit is configured to connect both the input and output circuits of the transistor under study, carried out by simply switching the measurement mode by means of a switch. The synchronization of all the main parts of the device, embedded in its design, frees potential users of the device from the need to perform a complex and, possibly, lengthy setup procedure. The claimed device allows you to view and demonstrate both input and output characteristics of both bipolar and field effect transistors of both structures. 5 ill.
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