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Light-Scattering Technique for the Study of Dynamic Thickness Fluctuations in Thin Liquid Films

机译:光学散射技术研究薄液膜动态厚度波动

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摘要

The authors describe a light-scattering technique capable of probing the dynamics of thickness fluctuations in lipid bilayers. The technique, which they call reflectance fluctuation spectroscopy (RFS), is keenly sensitive to light scattered from the squeeze modes of motion in a thin liquid film, and insensitive to light scattered from the bend modes. A laser beam is focused to a small spot on the film, and the power in the specularly reflected beam is recorded in real time. Thickness fluctuations associated with the squeeze modes of motion give rise to fluctuations in the power of the specularly reflected light. The frequency spectrum of the fluctuations in detected power (RFS spectrum) can be analyzed to yield values for the film viscosity and thickness compressibility. The authors present two independent theoretical derivations of the RFS spectrum and show that scattering from the bend mode can be neglected. The theoretical expression for the RFS spectrum is compared with experimental spectra obtained from glycerylmonooleate-decane bilayers. The fit of the theory to the data is excellent and the values deduced for the film viscosity and thickness compressibility are reasonable.
机译:作者描述了一种光散射技术,该技术能够探测脂质双层中厚度波动的动力学。他们称该技术为反射波动光谱(RFS),它对液体薄膜中挤压运动模式所散射的光非常敏感,而对弯曲模式所散射的光则不敏感。激光束聚焦到胶片上的一个小点,镜面反射光束的功率被实时记录。与挤压运动模式相关的厚度波动会引起镜面反射光的功率波动。可以分析检测到的功率波动的频谱(RFS频谱)以得出薄膜粘度和厚度可压缩性的值。作者介绍了RFS频谱的两个独立的理论推导,并表明可以忽略弯曲模式的散射。将RFS光谱的理论表达式与从甘油单油酸酯-癸烷双层获得的实验光谱进行比较。该理论与数据的拟合非常好,并且针对膜粘度和厚度可压缩性得出的值是合理的。

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