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Design, Fabrication and Testing of Monolithic Low-Power Passive Sigma-Delta Analog-to-Digital Converters

机译:单片低功耗无源sigma-Delta模数转换器的设计,制造和测试

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摘要

Analog-to-digital converters are critically important in electronic systems. Thedifficulty in meeting high performance parameters increases as integrated circuit designprocess technologies advance into the deep nanometer region. Sigma-delta analog-todigitalconverters are an attractive option to fulfill many data converter requirements.These data converters offer high performance while relaxing requirements on the precisionof components within an integrated circuit. Despite this, the active integrators found withinsigma-delta analog-to-digital converters present two main challenges. These challenges arethe power consumption of the active amplifier and achieving gain-bandwidth necessary forsigma-delta data converters in deep nanometer process technologies. Both of thesechallenges can be resolved through the replacement of active integrators with passiveintegrators at the expense of resolution.Three passive sigma-delta topologies were examined and characterized in detail.Two of these topologies were first-order and second-order noise shaping topologies. A newpassive topology was developed which was determined to be optimal in resolutioncompared to the two traditional designs. This topology exhibits a first-order signal transferfunction and a second-order noise transfer function. A method for increasing resolution ofpassive sigma-delta data converters despite inherent performance constraints wasdeveloped.Three example circuits were designed, fabricated and tested using OnSemiconductor’s C5 500 nanometer CMOS process. These designs were optimized for lowpower and utilized memory sense amplifiers as quantizing elements. The first circuit, usingpassive lumped on-chip elements for the noise shaping network achieved a powerconsumption of 100 micro-watts and an effective resolution of 8-bits. The second circuitreplaced the lumped components with switched-capacitor elements and achieved a powerconsumption of 6.75 micro-watts and an effective resolution of 9.3 bits. The third circuitwas designed as a case study for the application of the proposed topology to “K-delta-1-sigma” modulators. This circuit achieved a power consumption of 10 milli-watts and aneffective resolution of 8.5 bits.
机译:模数转换器在电子系统中至关重要。随着集成电路设计工艺技术发展到深纳米区域,满足高性能参数的难度增加。 Sigma-delta模数转换器是满足许多数据转换器要求的有吸引力的选择。这些数据转换器提供高性能,同时放宽了对集成电路组件精度的要求。尽管如此,在sigma-delta模数转换器中发现的有源积分器仍然面临两个主要挑战。这些挑战是有源放大器的功耗以及实现深纳米工艺技术中sigma-delta数据转换器所需的增益带宽。可以通过以分辨率为代价将有源积分器替换为无源积分器来解决这两个难题。详细研究了三种无源sigma-delta拓扑并对其进行了特征化。这两种拓扑分别是一阶和二阶噪声整形拓扑。开发了一种新的被动拓扑,该拓扑被确定为与两种传统设计相比在分辨率上最佳。该拓扑具有一阶信号传递函数和二阶噪声传递函数。开发了一种在固有性能限制的情况下提高无源sigma-delta数据转换器分辨率的方法。使用OnSemiconductor的C5 500纳米CMOS工艺设计,制造和测试了三个示例电路。这些设计针对低功耗进行了优化,并利用存储器读出放大器作为量化元件。第一个使用无源集总片上元件进行噪声整形的电路,功耗为100微瓦,有效分辨率为8位。第二个电路用开关电容器元件代替了集总元件,并实现了6.75微瓦的功耗和9.3位的有效分辨率。设计了第三电路作为案例研究,以将拟议的拓扑应用于“ K-delta-1-sigma”调制器。该电路的功耗为10毫瓦,有效分辨率为8.5位。

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  • 作者

    Roy Angsuman;

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  • 年度 2016
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  • 原文格式 PDF
  • 正文语种 English
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