The CMS Fast Beams Condition Monitor Backend Electronics based on MicroTCA technology

摘要

The Fast Beams Condition Monitor (BCM1F), upgraded for LHC Run II, is one sub-system of the Beam Radiation Instrumentation and Luminosity Project of the CMS experiment. It is based on 24 single crystal CVD diamond sensors. Each sensor is metallised with two pads, being read out by a dedicated fast frontend chip produced in 130 nm CMOS technology. Signals for real time monitoring are processed by custom-made back-end electronics to measure separately rates corresponding to LHC collision products, machine induced background and residual activation exploiting different arrival times. The system is built in MicroTCA technology and uses high speed analog-to-digital converters. The data processing module designed for the FPGA allows a distinguishing of collision and machine induced background, both synchronous to the LHC clock, from the residual activation products. In operational modes of high rates, consecutive events, spaced in time by less than 12.5 ns, may partially overlap. Hence, novel signal processing techniques are deployed to resolve overlapping peaks. The high accuracy qualification of the signals is crucial to determine the luminosity and the machine induced background rates for the CMS experiment and the LHC. The architecture of the backend electronics and the signal processing techniques will be presented and its performance thus far using data taken in LHC Run II.