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A Raman spectroscopic investigation of 1-alkanethiol self-assembled monolayers at Ag surfaces

机译:Ag表面1-烷硫醇自组装单层的拉曼光谱研究

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摘要

Initial Raman spectra of 1-alkanethiol self-assembled monolayers (SAMs) at mechanically polished (MP) polycrystalline Ag surfaces could not be accurately interpreted for alkanethiol conformational order, because the spectra indicated these monolayers were contaminated. From XPS and Raman spectra of the unmodified MP Ag surfaces, the primary contaminants were identified as graphitic carbon and alkyl hydrocarbons. As determined by XPS, mechanical polishing procedures were adopted which reduced the quantity of these contaminants; nonetheless, significant contaminant band intensity continued to be observed in Raman spectra of these alkanethiol SAMs. The contaminant was more accurately identified as a polyaromatic hydrocarbon (PAH) and its molecular identity was suggested as phenanthrene (phen). Attempts at its removal from the unmodified MP Ag surface by solvent dissolution and electrochemical reductive desorption were unsuccessful. However, this contaminant study was significant, because it initiated efforts to further reduce the quantity of this contaminant at the MP Ag surface. XPS and Raman spectra of chemically polished (CP) polycrystalline (poly) Ag surfaces indicated them to contain substantially less carbon contamination than the MP Ag surfaces. Thus, Raman spectra of short-chain alkanethiol SAMs at CP Ag (poly) and (chemically polished) Ag (111) were interpreted for alkanethiol conformational order. To better understand the signal intensities from CP Ag (poly), Ag (111), and MP Ag, surface enhancement factors (SEFs) at these surface types were quantified and compared to those measured for electrochemically-roughened (ORC) Ag, coldly-deposited Ag (Cold Ag), "thick" room temperature (RT)-deposited Ag, and MP Au. These SEFs were determined by reference of monolayer signal intensities at these surfaces to that from the unenhancing MP Pt surface (i.e., SEF of 1). Relative surface Raman sensitivities were assessed with use of these SEFs, and limits of detection (LODs) were calculated from the normalized S/N values in these surface spectra. Since the single spectrograph and Triplemate were both available for surface and normal Raman spectral acquisition, their relative performances were characterized to determine the advantages/disadvantages of each spectrograph. Specifically, the S/N and S/B values in spectra acquired on both spectrographs were quantified and compared.
机译:在机械抛光(MP)的多晶Ag表面上,1-链烷硫醇自组装单层(SAMs)的初始拉曼光谱无法准确地解释为链烷硫醇的构象顺序,因为光谱表明这些单层受到污染。从未经修饰的MP Ag表面的XPS和拉曼光谱中,主要污染物被鉴定为石墨碳和烷基烃。根据XPS的决定,采用了机械抛光程序,减少了这些污染物的数量。尽管如此,在这些链烷硫醇SAM的拉曼光谱中仍继续观察到明显的污染物带强度。该污染物被更准确地鉴定为聚芳烃(PAH),其分子身份被建议为菲(phen)。尝试通过溶剂溶解和电化学还原解吸将其从未改性的MP Ag表面去除,但未成功。但是,这项污染物研究意义重大,因为它启动了进一步减少MP Ag表面污染物数量的工作。化学抛光(CP)的多晶(poly)Ag表面的XPS和拉曼光谱表明,它们所含的碳污染比MP Ag表面要少得多。因此,在CP Ag(聚)和(化学抛光)Ag(111)处的短链烷硫醇SAM的拉曼光谱被解释为烷硫醇的构象顺序。为了更好地了解CP Ag(poly),Ag(111)和MP Ag的信号强度,对这些表面类型的表面增强因子(SEF)进行了量化,并与电化学粗糙化(ORC)Ag的测量值进行了比较,沉积的银(冷银),“厚”室温(RT)沉积的银和MP Au。通过参考这些表面上的单层信号强度与来自未增强的MP Pt表面的信号强度(即SEF为1)来确定这些SEF。使用这些SEF评估了相对表面拉曼灵敏度,并根据这些表面光谱中的归一化S / N值计算了检测限(LOD)。由于单谱仪和Triplemate均可用于表面和常规拉曼光谱采集,因此对它们的相对性能进行了表征,以确定每种谱仪的优缺点。具体而言,对在两个光谱仪上采集的光谱中的S / N和S / B值进行量化和比较。

著录项

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    Taylor Chad Eric 1968-;

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  • 年度 1998
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