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Bias-hardened CMB lensing with polarization

机译:偏光的偏光CMB透镜

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摘要

Polarization data will soon provide the best method for measuring the CMB lensing potential, although these data are potentially sensitive to several instrumental effects, including beam asymmetry, polarization angle uncertainties and sky coverage, as well as analysis choices, such as masking. We derive bias-hardened lensing estimators to mitigate these effects, at the expense of larger reconstruction noise, and we test them numerically on simulated data. We find that the mean-field bias from masking is significant for the EE quadratic lensing estimator. On the one hand, the bias-hardened estimator combined with filtering techniques can mitigate the mean field. On the other hand, the EB estimator does not significantly suffer from the mean field due to the point source masks and survey window function. However, the contamination from beam asymmetry and polarization angle uncertainties can generate mean-field biases for the EB estimator. These can also be mitigated using bias-hardened estimators, with at most a factor of ∼3 degradation of noise level compared to the conventional approach.
机译:极化数据将很快提供测量CMB透镜潜力的最佳方法,尽管这些数据可能对多种仪器效果敏感,包括光束不对称,极化角不确定性和天空覆盖范围以及分析选择(例如遮罩)。我们推导了偏光透镜估计,以减轻这些影响,但以较大的重建噪声为代价,并在模拟数据上进行了数值测试。我们发现,掩蔽的平均场偏差对于EE二次透镜估计量而言非常重要。一方面,将偏硬估计量与滤波技术相结合可以减轻平均场。另一方面,由于点源蒙版和测量窗口功能,EB估计器不会显着受到平均场的影响。但是,光束不对称和偏振角不确定性造成的污染会为EB估计器产生平均场偏差。这些也可以通过使用偏置硬化估计器来缓解,与传统方法相比,噪声水平最多降低约3倍。

著录项

  • 作者

    Namikawa T.; Takahashi R.;

  • 作者单位
  • 年度 2014
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  • 原文格式 PDF
  • 正文语种 en
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