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EMC Performance of Field Programmable Gate-Arrays: Effects of I/O Standards and Attributes on the Radiated Emissions Spectrum

机译:现场可编程门阵列的EMC性能:I / O标准和属性对辐射发射频谱的影响

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摘要

This research investigates what impact the I/O standards & attributes of a Field Programmable Gate Array have on the radiated emissions spectrum. FPGAs are used in countless digital applications. The use of a Spartan-6 FPGA gives a good representation of a general device with Xilinx being the market leader in supplying FPGAs for a variety of industries. The logic standard, drive strength and edge rate are examined for their impact on that radiated emissions produced. Digital integrated circuits are a well-known and documented source of Electromagnetic Interference due to the fast transitions of period signals. A practical and theoretical understanding of the behaviour of clock signals in the time and frequency domains has been established. The impact of phenomena such as overshoot and ringing from practical signals has been considered for its impact on the emissions spectrum and how this deviates from the theoretical expectations. Logic standard, drive strength and edge rate have been assessed comparatively to determine their influence of peak emissions produced. Of the logic standards tested the LVTTL standard recorded the highest level of EMI across all I/O logic standards approximately 4dB higher than the equivalent CMOS standards. The LVTTL standard recorded the largest variation in emissions across the available I/O driver settings with approximately a 14dB increase from the minimum to maximum I/O driver settings. The LVCMOS logic standards recorded on average across the 3.3 volts, 2.5 volts, 1.8 volts, 1.5 volts and 1.2 volts logic, a maximum change to EMI of approximately 10dB from the minimum to maximum driver settings. Each category of the variable I/O driver settings has been assessed independently to assess the level of change to emissions produced. Average levels of EMI produced under each I/O driver setting have also been obtained and presented to give engineers and designers an indication of how decisions made within the design process can influence the level of emissions produced. It is hoped that this research will provide as a useful tool when designing with programmable integrated circuits such as the Spartan-6 FPGA and the potential EMC impact on the radiated emissions spectrum.
机译:这项研究调查了现场可编程门阵列的I / O标准和属性对辐射频谱的影响。 FPGA用于无数的数字应用中。 Spartan-6 FPGA的使用很好地代表了通用器件,而Xilinx则是为各种行业提供FPGA的市场领导者。检查逻辑标准,驱动强度和边沿速率对产生的辐射的影响。由于周期信号的快速转换,数字集成电路是众所周知的电磁干扰源。已经建立了对时钟信号在时域和频域中行为的实践和理论理解。已经考虑到诸如过冲和来自实际信号的振铃之类的现象的影响,因为其对发射频谱的影响以及其与理论预期的偏离程度。已对逻辑标准,驱动强度和边沿速率进行了比较评估,以确定它们对产生的峰值排放的影响。在测试的逻辑标准中,LVTTL标准记录了所有I / O逻辑标准中的最高EMI水平,比等效的CMOS标准高大约4dB。 LVTTL标准记录了可用I / O驱动程序设置中的最大发射变化,从最小I / O驱动程序设置到最大I / O驱动程序设置大约增加了14dB。 LVCMOS逻辑标准平均记录了3.3伏,2.5伏,1.8伏,1.5伏和1.2伏逻辑,从最小驱动器设置到最大驱动器设置,EMI的最大变化约为10dB。已分别评估可变I / O驱动程序设置的每种类别,以评估产生的排放变化的水平。还获得并给出了每种I / O驱动器设置下产生的EMI的平均水平,以使工程师和设计人员了解设计过程中的决策如何影响所产生的辐射水平。希望这项研究将为使用诸如Spartan-6 FPGA之类的可编程集成电路设计以及对辐射频谱的潜在EMC影响提供有用的工具。

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    Boden Mark;

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