首页> 外文OA文献 >Coupling of relative intensity noise and pathlength noise to the length measurement in the optical metrology system of LISA Pathfinder
【2h】

Coupling of relative intensity noise and pathlength noise to the length measurement in the optical metrology system of LISA Pathfinder

机译:LISA Pathfinder光学计量系统中相对强度噪声和路径长度噪声与长度测量的耦合

摘要

LISA Pathfinder is a technology demonstration mission for the space-based gravitational wave observatory, LISA. It demonstrated that the performance requirements for the interferometric measurement of two test masses in free fall can be met. An important part of the data analysis is to identify the limiting noise sources. [1] This measurement is performed with heterodyne interferometry. The performance of this optical metrology system (OMS) at high frequencies is limited by sensing noise. One such noise source is Relative Intensity Noise (RIN). RIN is a property of the laser, and the photodiode current generated by the interferometer signal contains frequency dependant RIN. From this electric signal the phasemeter calculates the phase change and laser power, and the coupling of RIN into the measurement signal depends on the noise frequency. RIN at DC, at the heterodyne frequency and at two times the heterodyne frequency couples into the phase. Another important noise at high frequencies is path length noise. To reduce the impact this noise is suppressed with a control loop. Path length noise not suppressed will couple directly into the length measurement. The subtraction techniques of both noise sources depend on the phase difference between the reference signal and the measurement signal, and thus on the test mass position. During normal operations we position the test mass at the interferometric zero, which is optimal for noise subtraction purposes. This paper will show results from an in-flight experiment where the test mass position was changed to make the position dependant noise visible.
机译:LISA探路者是LISA天基重力波天文台的技术演示任务。结果表明,可以自由落体对两个测试质量进行干涉测量的性能要求。数据分析的重要部分是确定限制噪声源。 [1]此测量是通过外差干涉法进行的。该光学计量系统(OMS)在高频下的性能受到感测噪声的限制。一种这样的噪声源是相对强度噪声(RIN)。 RIN是激光的特性,干涉仪信号产生的光电二极管电流包含频率相关的RIN。相位计从该电信号计算出相位变化和激光功率,并且RIN与测量信号的耦合取决于噪声频率。直流时的RIN,外差频率和外差频率的两倍耦合到相位。高频下的另一个重要噪声是路径长度噪声。为了减少影响,可以通过控制回路来抑制这种噪声。未抑制的路径长度噪声将直接耦合到长度测量中。两个噪声源的减法技术取决于参考信号和测量信号之间的相位差,并因此取决于测试质量位置。在正常操作中,我们将测试质量定位在干涉仪零点处,这对于减噪目的是最佳的。本文将显示飞行实验的结果,在该实验中,改变了测试质量位置,从而使位置相关的噪声可见。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号