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Investigation of x-ray emission from high-current discharges of the PF type

机译:PF型大电流放电产生的X射线研究

摘要

The invited paper reports on measurements of soft x-rays emitted from hot plasmas produced in a modernisedud PF-1000U facility. The discharges were performed at the D2-filling with or without a Ne-admixture, under the initialud pressure of 0.9 or 1.5 Torr and at the initial charging voltage equal to 16 or 18 kV. Time-integrated x-ray imagesud were recorded with a pinhole camera situated side-on, at an angle of 75º to the z-axis. Differences in the pinchud column structure were observed. Time-resolved measurements were performed with four PIN diodes located behindud filtered pinholes. Two couples of PIN diodes (with Be-filters of 7 and 10 μm in thickness) observed 30 mm-diam.ud regions which had centres at a distance of 30 and 60 mm form the electrode outlets. From the recorded timeresolvedud x-ray signals the electron temperatures (Te) were calculated. For the pure D2-discharges the estimated Teud values ranged from 75 to 250 eV depending on the discharge conditions. For discharges with a Ne-admixture Te values were higher and reached about 800 eV.
机译:受邀的论文报告了在现代化的 ud PF-1000U设施中产生的热等离子体发射出的软X射线的测量结果。放电是在D2填充或不添加Ne混合物的情况下,在0.9或1.5 Torr的初始 ud压力和等于16或18 kV的初始充电电压下进行的。使用侧向并与z轴成75º的针孔照相机记录了时间积分的X射线图像 ud。观察到夹点 ud柱结构的差异。时间分辨的测量是通过位于 ud过滤的针孔后面的四个PIN二极管进行的。观察到两对PIN二极管(厚度分别为7和10μm的Be滤波器)的直径为30 mm的区域,其中心位于30和60 mm的距离处,形成了电极出口。根据所记录的时间分辨的 ud x射线信号,计算出电子温度(Te)。对于纯D2放电,取决于放电条件,估计的Te ud值范围为75至250 eV。对于带有Ne混合物的放电,Te值更高,达到约800 eV。

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