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FIB patterning of stainless steel for the development of nano-structured stent surfaces for cardiovascular applications

机译:FIB图案化的不锈钢,用于开发用于心血管应用的纳米结构支架表面

摘要

Stent implantation is a percutaneous interventional procedure that mitigates vessel stenosis, providing mechanical support within the artery and as such a very valuable tool in the fight against coronary artery disease. However, stenting causes physical damage to the arterial wall. It is well accepted that a valuable route to reduce in-stent re-stenosis can be based on promoting cell response to nano-structured stainless steel (SS) surfaces such as by patterning nano-pits in SS. In this regard patterning by focused ion beam (FIB) milling offers several advantages for flexible prototyping. On the other hand FIB patterning of polycrystalline metals is greatly influenced by channelling effects and redeposition. Correlative microscopy methods present an opportunity to study such effects comprehensively and derive structure–property understanding that is important for developing improved patterning. In this chapter we present a FIB patterning protocol for nano-structuring features (concaves) ordered in rectangular arrays on pre-polished 316L stainless steel surfaces. An investigation based on correlative microscopy approach of the size, shape and depth of the developed arrays in relation to the crystal orientation of the underlying SS domains is presented. The correlative microscopy protocol is based on cross-correlation of top-view scanning electron microscopy, electron backscattering diffraction, atomic force microscopy and cross-sectional (serial) sectioning. Various FIB tests were performed, aiming at improved productivity by preserving nano-size accuracy of the patterned process. The optimal FIB patterning conditions for achieving reasonably high throughput (patterned rate of about 0.03 mm2/h) and nano-size accuracy in dimensions and shapes of the features are discussed as well.
机译:支架植入是一种可减轻血管狭窄的经皮介入手术,可在动脉内提供机械支撑,因此是对抗冠状动脉疾病的非常有价值的工具。但是,支架置入会对动脉壁造成物理损伤。众所周知,减少支架内再狭窄的一种有价值的途径可以基于促进细胞对纳米结构不锈钢(SS)表面的反应,例如通过在SS中构图纳米凹坑。在这方面,通过聚焦离子束(FIB)铣削进行的图案化为灵活的原型制作提供了多个优势。另一方面,多晶金属的FIB图案受沟道效应和再沉积的影响很大。相关的显微镜方法提供了一个机会,可以全面研究这种影响并获得对结构-属性的理解,这对开发改进的图案非常重要。在本章中,我们介绍了一种FIB图案化协议,用于在预抛光316L不锈钢表面上按矩形阵列排列的纳米结构特征(凹面)。提出了一种基于相关显微镜方法的研究,即相对于基本SS域的晶体取向,所开发阵列的大小,形状和深度。相关显微镜协议基于俯视扫描电子显微镜,电子反向散射衍射,原子力显微镜和横截面(串行)切片的互相关性。进行了各种FIB测试,旨在通过保留图案化工艺的纳米尺寸精度来提高生产率。还讨论了用于实现相当高的通量(约0.03 mm2 / h的图案化速率)和特征尺寸和形状的纳米级精度的最佳FIB图案形成条件。

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