Atomic Force Microscopy and Fourier Transform Infrared Studies of the Influenceof a Highly Oriented Poly(tetrafluoroethylene) Substrate on Poly(ethylene terephthalate) Overlayers

摘要

Atomic force microscopy (AFM) and Fourier transform infrared spectroscopy (FTIR)were used to investigate the nature of poly(ethylene terephthalate) (PET) films formed on the surface of a highly oriented poly(tetrafluoroethylene) (PTFE) substrate mechanically deposited on silicon wafers. PTFE films have been previously shown to be highly effective substrates for the growth of oriented overlayers, such materials often have unique properties. In this study the authors report FTIR observations of an increase in crystallinity of a PET film formed on such an oriented substrate when compared to a film formed on the untreated silicon wafer. AFM imaging is used to show the deeply contrasting surface of the PET film formed on each substrate.