首页> 美国政府科技报告 >In situ Characterization of CVD-Processes by Raman Scattering: Determination ofthe Kinetics of the Hydrogen Reduction of WF6 (In situ Karakerisatie van CVD-Processen met Behulp van Raman Verstrooiing: Bepaling van de Kinetiek van de Reactie Tussen Waterst
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In situ Characterization of CVD-Processes by Raman Scattering: Determination ofthe Kinetics of the Hydrogen Reduction of WF6 (In situ Karakerisatie van CVD-Processen met Behulp van Raman Verstrooiing: Bepaling van de Kinetiek van de Reactie Tussen Waterst

机译:拉曼散射对CVD过程的原位表征:WF6氢还原动力学的测定(原位Karakerisatie van CVD-processen遇到Behulp van Raman Verstrooiing:Bepaling van de Kinetiek van de Reactie Tussen Waterst

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;Contents: General Introduction; Influence of the gasphase on the properties ofCVD tungsten films; Raman scattering; Experimental detials; Influence of temperature gradients on partial pressures; A kinetic study of the tungsten deposition from h2/WF6-mixture based on in situ partial pressure measurements.

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