首页> 美国政府科技报告 >Application of Static Secondary Ion Mass Spectrometry to Trace Evidence Analysis
【24h】

Application of Static Secondary Ion Mass Spectrometry to Trace Evidence Analysis

机译:静态二次离子质谱在痕量证据分析中的应用

获取原文

摘要

State-of-the-art secondary ion mass spectrometry (SIMS) instrumentation was applied to the characterization of samples representative of trace evidence. The purpose of the study was to assess the efficacy of static SIMS for providing highly specific chemical characterization of trace evidence samples. It was found that samples coated with automotive paint and with nail polishes could be distinguished based on their SIMS spectra, provided the data was reduced using multivariate analysis techniques. It was also found that hair samples could be readily characterized in terms of the consumer chemicals present on the surface, namely, soap and softener chemicals. Other studies showed that the drugs of abuse heroin and cocaine could be readily detected on fiber surfaces using SIMS. In order to perform the hair and fiber studies, methods for analyzing hair and fiber samples required development. On the basis of these studies, it was concluded that the technique has the potential for providing a chemical-specific characterization for a variety of trace evidence characterizations. At the present time, limitations of the technique are the high cost of the instrumentation. and the high level of expertise required for routine operation, and more importantly, data interpretation.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号