SEM 2000; Scanning Electron Microscopy: Imaging and Microanalysis

摘要

The title of this report is also the title of a three-day SEM course held October17-19 2000 in Gothenburg. The course was arranged by the Microscopy and Microanalysis group at the department of Experimental Physics at Chalmers University of Technology. The contents of the course was a mixture of lectures on SEM theory and demonstrations. Some fifty participants from various companies, around twenty representatives for manufacturers and a couple of lecturers from different universities participated in the course. This report contains a summary of the lectures given.