Electronics and Electrical Engineering Laboratory, Semiconductor Electronics Division, Programs, Activities, and Accomplishments

摘要

;Contents: Welcome; Mission; Vision; Values; Goals; Semiconductors: Backbone of the Electronic/Digital Revolution; Semiconductor Electronic Division Organization; Scanning-Probe Microscope Metrology; Advanced MOS Device Reliability and Characterization; Nanoelectronic Device Metrology; Thin-Film Process Metrology; Power Semiconductor Device and Thermal Metrology; MicroElectroMechanical Systems; Electrical Test Structure Metrology; Major Facilities/Laboratories; Microfabrication Process Facility; National Research Council (NRC) Post-Doctoral Opportunities; 2003 International Conference on Characterization and Metrology for ULSI Technology, Mar. 24-28, 2003, Austin TX; Gaitan Receives DoC Silver Medal Award; Division Teamwork Team Receives DoC Bronze Medal Award; Integrated Circuit Gas Sensing System Technology Valuable for Homeland Security; SPS Intern Contributes to the University of Puerto Rico at Mayaguez Strengthens Power Electronics Research; Educational Outreach by Division Staff; Future NIST Cleanroom Facility on Track for Spring 2003 Completion; and NIST's Gaithersburg, Maryland Campus and Surrounding Area.