Uncertainty Analysis for NIST Noise-Parameter Measurements; Technical note

摘要

The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters. An overview of the Monte Carlo program used to evaluate the type-B uncertainties is included.