RESEARCH CONSISTING OF SPECTROGRAPHIC ANALYSIS OF SAMPLES AND DEVELOPMENT OF SPECTROGRAPHIC METHODS FOR THE DETERMINATION OF IMPURITIES IN PURE SILICON

摘要

Eighty-three samples were submitted for spectrocheraical analysis from the Air Force Cambridge Research Center Radiochemistry Section. This required the excitation of 332 samples and 5,976 determ¬inations. The analytical results have been forwarded to the Radio-chemistry Section. The remainder of the Quarter was concerned with the research phase of the Contract.