Fault Testing and Diagnosis Implementation in Microprocessor Controlled Data Networks

摘要

Fault testing technique is reviewed and on-line self test procedures for microprocessor systems are proposed. Random access memory (RAM) test procedures with half the test time requirement of the known RAM minimum test pattern, MASEST, and increased applicability are considered. Global self test procedures for microprocessor units, derived from a combination of structural, functional and behavioral approaches, specified by introducing algorithmic patterns, and composed of sequential dedicated programs, each of which has its own meaningful test objective are discussed. Oriented test procedures based on the combination of the philosophy of real time tests and the partitioning of the applications programs by controllability observability and maintenance engineering technique (COMET) are presented.