Michelson Interferometer

摘要

The Michelson Interferometer is a device used in many applications, but here it was used to measure small differences in distance, in the milli-inch range, specifically for defects in the Orbiter windows. In this paper, the method of using the Michelson Interferometer for measuring small distances is explained as well as the mathematics of the system. The coherence length of several light sources was calculated in order to see just how small a defect could be measured. Since white light is a very broadband source, its coherence length is very short and thus can be used to measure small defects in glass. After finding the front and back reflections from a very thin glass slide with ease and calculating the thickness of it very accurately, it was concluded that this system could find and measure small defects on the Orbiter windows. This report also discusses a failed attempt for another use of this technology as well as describes an area of promise for further analysis. The latter of these areas has applications for finding possible defects in Orbiter windows without moving parts.