Optimal AR-Coating for Optical Waveguide Devices

摘要

The optimal index of refraction and thickness of an Antireflection (AR) coatinglayer for optical modes (TE/TM) in semiconductor laser devices was calculated. Various correction factors concerning the two dimensional carrier gas were taken into account: the change in photonic energy depending on the width of the quantum well, the resulting change in refractive indexes, and the change in effective masses of the carriers. The effective optical model index is compared to the exact calculated value for the optimal coating index.