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X-ray Photoelectron Spectroscopy (XPS), Rutherford Back Scattering (RBS) Studies

机译：X射线光电子能谱（Xps），卢瑟福背散射（RBs）研究

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X-ray photoelectron spectroscopy (XPS), Rutherford Back Scattering (RBS) studiesof each of sample received were completed. Since low angle X-ray could not be performed because of instrumentation problems, Auger spectrometry was employed instead. The results of these measurements for each of the samples is discussed in turn.

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作者
Neely, W. C.; Bozak, M. J.; Williams, J. R.;
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年度 1993
页码
总页数 41
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Aluminum alloys; Auger spectroscopy; Backscattering; Electron transitions; Photoelectron spectroscopy; X ray spectroscopy; Adsorption; Beryllium; Stoichiometry; Thin films;

机译：铝合金;俄歇光谱;背向散射;电子跃迁;光电子能谱; X射线光谱;吸附;铍;化学计量;薄膜;

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2. Oxygen adsorption on Ag(111): X-ray photoelectron spectroscopy (XPS), angular dependent x-ray photoelectron spectroscopy (ADXPS) and temperature-programmed desorption (TPD) studies [J] . V. I. Bukhtiyarov, V. V. Kaichev, I. P. Prosvirin The Journal of Chemical Physics . 1999,第5期

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4. Surface and Interface Analysis of Mg/sub x/Zn/sub 1-x/O cubic and hexagonal phases by X-Ray Photoelectron and Rutherford Back Scattering Spectroscopies [C] . Hullavarad, S.S., Pugel, . 2005

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6. High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies [O] . V. N. Strocov, T. Schmitt, U. Flechsig, -1

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7. Effects of ion beam bombardment on electrochromic tungsten oxide films studied by X-ray photoelectron spectroscopy and Rutherford back-scattering [O] . Wong HY, Ong CW, Kwok RWM, 2000

机译：X射线光电子能谱和卢瑟福背散射研究离子束轰击对电致变色氧化钨膜的影响
8. X-ray Photoelectron Spectroscopy (XPS), Rutherford Back Scattering (RBS) studies [R] . Neely, W. C., Bozak, M. J., Williams, J. R. 1993

机译：X射线光电子能谱（Xps），卢瑟福背散射（RBs）研究

X-ray Photoelectron Spectroscopy (XPS), Rutherford Back Scattering (RBS) Studies

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