Portable Infrared Reflectometer Designed and Manufactured for Evaluating Emittance in the Laboratory or in the Field.

摘要

The optical properties of materials play a key role in spacecraft thermal control. In space, radiant heat transfer is the only mode of heat transfer that can reject heat from a spacecraft. One of the key properties for defining radiant heat transfer is emittance, a measure of how efficiently a surface can reject heat in comparison to a perfect black body emitter. Heat rejection occurs in the infrared region of the spectrum, nominally in the range of 2 to 25 mm. To calculate emittance, one obtains the reflectance over this spectral range, calculates spectral absorptance by difference, and then uses Kirchhoff s Law and the Stefan-Boltzmann equation to calculate emittance. A new portable infrared reflectometer, the SOC 400t, was designed and manufactured to evaluate the emittance of surfaces and coatings in the laboratory or in the field. It was developed by Surface Optics Corporation under a contract with the NASA Glenn Research Center at Lewis Field to replace the Center s aging Gier- Dunkle DB-100 infrared reflectometer. The specifications for the new instrument include a wavelength range of 2 to 25 mm; reflectance repeatability of +/-1 percent; self-calibrating, near-normal spectral reflectance measurements; a full scan measurement time of 3.5 min, a sample size of 1.27 cm (0.5 in.); a spectral resolution selectable from 4, 8, 16, or 32/cm; and optical property characterization utilizing an automatic integration to calculate total emittance in a selectable temperature range.