首页> 美国政府科技报告 >FILM THICKNESS MEASUREMENT IN ANNULAR TWO-PHASE FLOW USING A FLUORESCENCE SPECTROMETER TECHNIQUE. Part II. Studies of the shape of disturbance waves
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FILM THICKNESS MEASUREMENT IN ANNULAR TWO-PHASE FLOW USING A FLUORESCENCE SPECTROMETER TECHNIQUE. Part II. Studies of the shape of disturbance waves

机译:采用荧光光谱技术测量环形两相流中的薄膜厚度。第二部分。研究干扰波的形状

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A set of experiments is described in which the shape in space of the large disturbance waves in annular flow has been determined by use of the fluorescence technique, to obtain amplitude/time data, together with conductance probes to allow a simultaneous velocity measurement. The waves are typically, of amplitude 5 times the mean liquid film thickness and have an axial length dimension of the order ½ - 1 inch.

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