Application of Proton Induced X-Ray Emission to the Element Analysis of Thick Obsidian Samples.

摘要

The proton induced X-ray emission (PIXE) technique has been applied to the analysis of element concentrations in obsidian source samples. No target preparation other than washing and the selection of a flat surface was undertaken. Thick target yields have been calculated and element concentrations derived from the detected X-ray spectra; concentrations are given for K, Ca, Ti, V, Mn, Fe, Ga, As, Rb, Sr, Y, Zr, Nb, Ta, and Pb. A pinhole filter is described which enables a single measurement of about 5 minutes duration to give element concentration data over an X-ray energy range 3 to 20 keV. (Atomindex citation 12:601582)