On-Line Analysis, by X-Ray Diffraction, of Fluorspar-Containing Slurries

摘要

An on-line instrument developed by the National Institute for Metallurgy was used in a feasibility study on the applicability of X-ray diffraction to the analysis of fluorspar-containing slurries. The instrument is shown to have adequate sensitivity and resolution for the purpose, and further testwork is recommended. (Atomindex citation 14:770779)