In Situ High Voltage Electron Microscope Studies of Ion- and Electron-Beam Induced Modification of Materials

摘要

In situ high-voltage electron microscope (HVEM) studies have shown that the highly focused electron beams normally employed for irradiation purposes in the HVEM can cause easily measurable composition changes in the irradiated volume of thin alloy films (Ni-Al). The kinetics of this ''beam-induced'' composition change has been investigated and found to exhibit a strong dependence not only on temperature and peak electron flux, but also on the beam diameter. The dependence on beam diameter has far reaching implications for HVEM studies of radiation effects in alloys, and for microchemical analysis techniques such as EDX and EELS. (ERA citation 11:020262)