EXAFS (Extended X-ray Adsorption Fine Structures) Studies of Multilayer Interfaces.

摘要

Important for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni-Ti multilayers. 6 refs., 6 figs. (ERA citation 14:023697)