Design of the Extended X-ray Absorption Fine Structure (EXAFS) Beam-Line at INDUS-II Synchrotron Source

摘要

An Extended X-ray Absorption Fine Structure (EXAFS) beam line for X-ray absorption studies using energy dispersive geometry and position sensitive detector is being designed for the INDUS-II Synchrotron source. The optical design of the beam line has been completed based on the working principle that a single crystal bent in the shape of an ellipse by a crystal bender would act as a dispersing as well as focusing element. The mechanical design of the beam line including the crystal bender has also been completed and the components are being developed indigenously. Calculations have been done to determine the temperature profile on the different components of the beam line under exposure to synchrotron radiation and proper cooling channels have been designed to bring down the heat load on the components.