Dihedral Sample Mount for Off-Normal RAM Performance Measurements

摘要

A novel sample mount has been designed for making high angle of incidence radar absorbing material (RAM) sample performance measurements. The sample mount allows for 47 degrees angle of incidence measurement of RAM millimeter-wave (MMW) reflectivity (performance). Measurements are taken from 26-60 GHz and 75-100 GHz in the U.S. Army Research Laboratory's (ARL) Weapons and Materials Research Directorate (WMRD) Composites and Lightweight Structures Branch (CLSB) anechoic chamber. RAM samples can also be mounted in a full dihedral configuration for simulation of RAM performance in double bounce (corner)-type locations. Performance of two commercial-type RAM materials was measured at close to normal and at the 47 degrees off-normal angles of incidence. A full dihedral covered with one of the commercial RAMs was also tested. The mount will allow for more realistic evaluation of ARL- and contractor-designed RAM and other coatings to be utilized in low-observable Army and Department of Defense (DOD) projects.