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X-Ray Reciprocal Space Mapping of Coincided As-Clusters/GaAs and delta- InAs/GaAs Superlattices Grown at Low Temperature.

机译:低温生长的同向砷簇/ Gaas和δ-Inas / Gaas超晶格的X射线倒易空间映射。

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摘要

X ray reciprocal space mapping was employed to assess the crystalline quality of the delta-InAs/GaAs superlattices grown at low temperatures and structural transformations related to formation of As-cluster/GaAs superlattices upon post-growth anneal.

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