Scanning Force Microscopy of Nanostructured Conducting Composites and Polymeric Materials

摘要

The Scanning Probe Microscope at Howard University is functional. The SPM is a centerpiece in the laboratory of Professor Huber. The AFM is used in the performance of the grant DAAD19-99-1-0282 for the testing and fabrication of nanostructured thermoelectric materials and devices based in Bi and Bi-Sb alloys. These materials are sought for thermoelectric applications at around 100 K, such as detector coolers and cryogen shields. The report itemizes other grants and proposal based on the AFM and purchase details. The report also describes activities such as training of students, a new course being developed and offered. The report also presents research results: Optical Microscopy and electric Force Characterization of a Bi nanowire, AFM and living cells (with Dr. Palmer a co-investigator in the original proposal), and the research in Bi nanowires. Finally, the report presents a list of collaborators involved in making the instrument into a true research facility.