Measurement of Stress in Ceramic Laminates With Micro-Raman

摘要

Residual stresses in laminate ceramic composites were measured by micro-Raman spectroscopy. The research proceeded from laminate samples preparation, which included the mixture of powders in certain proportions, grinding them up to submicron dispersity, rolling of the tapes, placing the tapes in a certain order, and hot pressing. Several different ceramic laminates, such as Ti3SiC2-ZrO2, B4C-SiC, and Si3N4-TiN, were used for the determination of residual stresses by micro-Raman. The AlMgB-TiB2 superhard laminates are being prepared by SHS powder synthesis and hot pressing. The residual stresses in Ti3SiC2-based laminates were not significant, because of the small mismatch in CTEs of Ti3SiC2 and ZrO2. In B4C-SiC laminates, residual stresses could be measured from the shift of transverse optic (TO, 790/cm) and longitudinal optic (LO, 973/cm) phonon modes. In silicon nitride-based laminates several Raman bands could be used for the determination of the surface residual stresses. (3 tables, 5 figures).