首页> 美国政府科技报告 >Flux Pinning in YBa2Cu3O7-delta Thin Film Samples Linked to Stacking Fault Density (Postprint)

【24h】

Flux Pinning in YBa2Cu3O7-delta Thin Film Samples Linked to Stacking Fault Density (Postprint)

机译：YBa2Cu3O7-delta薄膜样品中的焊剂钉扎与堆垛层错密度相关（后印刷）

获取原文

页面导航

摘要
著录项
相似文献
相关主题

摘要

In this paper, we report a strong correlation between the stacking fault (SF) density and the critical current density of YBa2Cu3O7-8; (YBCO) thin films in applied field (Jc in-field). We found that the Jc in-field.

著录项

作者
Wang, J.; Kwon, J. H.; Yoon, J.; Wang, H.; Haugan, T. J.;
展开▼
作者单位

展开▼
年度 2008
页码 p.1-5
总页数 5
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Deposition; Yttrium barium copper oxides; Thin films; High temperature superconductors; Defects(Materials); Microstructure; Reprints;

机译：沉积;钇钡铜氧化物;薄膜;高温超导体;缺陷（材料）;微观结构;重印;

相似文献

外文文献
中文文献
专利

1. 密排六方钛中基面堆垛层错导致的孪晶界滑移、孪生台阶及孪晶生长:第一性原理研究 [J] . 钱琦, 刘正卿, 江勇, 中国有色金属学报：英文版 . 2021,第002期
2. Flux pinning in YBa_2Cu_3O_(7-δ) thin film samples linked to stacking fault density [J] . J. Wang, J. H. Kwon, J. Yoon, Applied Physics Letters . 2008,第8期

机译：与堆叠缺陷密度相关的YBa_2Cu_3O_（7-δ）薄膜样品中的助焊剂钉扎
3. Strong c-axis correlated pinning and hybrid pinning in YBa2Cu3O7-delta films containing BaHfO3 nanorods and stacking faults [J] . Horide Tomoya, Otsubo Koji, Kita Ryusuke, Superconductor Science & Technology . 2017,第7期

机译：含有BahFO3纳米棒和堆叠故障的YBA2Cu3O7-Delta薄膜中强的C轴相关钉扎和杂种钉夹
4. Formation of stacking faults and their correlation with flux pinning and critical current density in Sm-doped YBa_2Cu_3O_(7_8) films [J] . Sung Hun Wee, Eliot D. Specht, Claudia Cantoni, Physical review . 2011,第22期

机译：掺Sm的YBa_2Cu_3O_（7_8）薄膜中堆垛层错的形成及其与磁通钉扎和临界电流密度的关系
5. Measurements of flux pinning and critical current density in YBCO thin films [C] . T. Fujiwara, Y. Fujii, T. Suzuki, 低温工学·超電导学会会議 . 2000

机译：YBCO薄膜磁通循环和临界电流密度的测量
6. Single-fiber bidirectional optoelectronic links using three-dimensional stacked thin film emitters and detectors. [D] . Geddis, Demetris Lemarcus. 2003

机译：使用三维堆叠的薄膜发射器和检测器的单纤维双向光电链路。
7. Atomic mapping of Ruddlesden-Popper faults in transparent conducting BaSnO3-based thin films [O] . W. Y. Wang, Y. L. Tang, Y. L. Zhu, -1

机译：BaSnO3透明导电薄膜中Ruddlesden-Popper断层的原子映射
8. Formation of stacking faults and their correlation with flux pinning and critical current density in Sm-doped YBa2Cu3O7−δfilms [O] . Sung Hun Wee, Eliot D. Specht, Claudia Cantoni, 2011

机译：与SM掺杂YBA2CU3O7-ΔFilms中的堆叠故障形成及其与磁通钉钉和临界电流密度的相关性

Flux Pinning in YBa2Cu3O7-delta Thin Film Samples Linked to Stacking Fault Density (Postprint)

摘要

著录项

相似文献

相关主题

期刊订阅